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Valluri Rao is an Intel Fellow and Director of Analytical and Microsystems Technology in Intel's Technology and Manufacturing group. Rao is currently responsible for the research and development of novel Microsystems and Micromechanical (MEMS) applications for Intel.
Rao, who joined Intel in 1983, pioneered numerous silicon characterization techniques for microprocessor performance, debug and yield enhancement. Some of these techniques included, Electron Beam approaches, Ultra-fast Optical measurement and Silicon Micromachining methods for on chip reconfiguring and repairing of circuits. In addition these tools and methods were refined to work with flip chip packaging, when Intel transitioned to this packaging technology. The tools and related infrastructure, which included integration into Intel's physical CAD environment, were widely deployed throughout Intel to all of the design centers, analytical labs, assembly and test sites and FABs. Rao worked on Intel microprocessors starting from the 80386 to the first generation of the Itanium chips.
Rao also initiated Intel's early work on Optical Interconnects and currently oversees university based Opto-Electronics research through the research council at Intel.
Rao holds 46 issued patents, 3 Intel achievement awards and has published more than 20 external and 10 internal papers.
Rao received Bachelor's, Master's and Ph.D. degrees in electrical engineering from Jesus College, Cambridge University, U.K.. He was a post-doctoral research fellow at the Engineering Department Cambridge from 1979 - 1983.
He was born in Andhra Pradesh, India. | 