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Neal R. Mielke is an Intel Fellow in the Technology and Manufacturing Group and Director of Reliability Methods.
Mielke is responsible for characterizing the reliability of new Intel silicon technologies. He joined Intel in 1979 and worked in quality and reliability for non-volatile memories such as EPROMs, E2PROMs and flash. He later worked in the development of non-volatile memories including Intel's original flash products and on the reliability of Intel's logic technologies.
Mielke received a bachelor's degree in physics and an master's degree in electrical engineering from Stanford University in 1979. Born in Palo Alto, Calif., he has 19 patents, 14 publications and four Intel Achievement Awards. | 